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News and Events

Incoming Events

 17th WCNDT, Shanghai China, October 25-28, 2008

ScanMaster is going to take a part at the 17th world conference of non-destructive testing that will be held in Shanghai,China. The Conference will be a grand event among the NDT personnel from all over the world. Come see and visit us at the International Hall, booth 1224.

For more information 17th WCNDT

 INDIA ITME 2008, Bangalore India, November 15-22, 2008

The 8th India International Textile Machinery Exhibition (INDIA ITME 2008) is to be held from 15th to 22nd November 2008 at the Bangalore International Exhibition Centre (BIEC), India. The exhibition will give an opportunity to access our new technology and developments in textile automatic inspection process. We at EVS will be there to present the latest innovative IQ-TEX 3rd generation system.
The IQ-TEX 3rd generation system based on Smart Vision Cameras that automatically detects, memorizes, displays and further grades defects and irregularities in textile fabrics and industrial fabrics. The IQ-TEX 3rd generation system is based on vast history of hundreds systems installed worldwide.
EVS' stand will be located in Hall No.: 3 - Lower Level, Booth No.: B-120 with the Sagar Group stand. We are looking forward to meet you there.

For more information INDIA ITME 2008

Recent Events

  ITMA 2007, Sep. 2007

With almost 20 years of experience in the field of automatic in-line optical web inspection and quality monitoring systems, EVS took part at the ITMA 2007 for the 4th time.
ITMA 2007 in Munich, the 15th International Exhibition of Textile Machinery, attracted 118,000 trade visitors from 149 countries.
It was a very successful event for EVS, giving the opportunity to present our leading technology of web inspection. Beni Mano, VP Sales Vision, commented: “We welcomed over 1000 visitors to our booth. Our innovative platform that combines superior image acquisition with simpler than ever integration to the production line have attracted a lot of interest in the market”.
  ITMA 2007

 

 EVS Seminar, May 2007

The second EVS’s Seminar took place in our new facility in Kadima, Israel. 25 visitors from 17 countries participated in our event. The purpose of this event was to improve our business relationship with you, to give you the opportunity to meet our new management team, to provide an opportunity for exchanging information, to discuss future cooperation options and market trends and to expose you to new applications and developments in the Vision field, as presented by our team.

From the comments we had received we concluded that this event was very beneficial. Here are some extracts from the visitors’ comments, followed by some pictures from the event:

 

  • “Excelent opportunity to meet the EVS crew and exchange experience with all the agents across the world. It was a good idea and you done a great job”
  • “Many thanks for the worth and efforts. It was very worthwhile.”
  • “The management of the event was superb!”
  • “We received a very warm welcome and your hospitality has been very generous. Thank you!”
  EVS’s Seminar

  ScanMaster’s Business Partners Event, October 7-9, 2007

ScanMaster’s Business Partners Event took place in our new facility in Kadima, Israel. 28 representatives  from 14 countries participated in our event. The purpose of this event was to improve our business relationship with you, to give you the opportunity to meet our new management team, to provide an opportunity for exchanging information, to discuss future cooperation options and market trends and to expose you to new applications and developments in the UT field, as presented by our team.

From the comments we had received we concluded that this event was very beneficial. Here are some extracts from the visitors’ comments:

  • “To you and your team, thank you. This was worth all time and effort. Well done!”
  • “Thank you for a splendid experience!”
  • “It was very well organized conference. It gave an opportunity for meeting people whom you are always working with. This should be an important benefit in long-term.”

 

More Information

  

   17th WCNDT

 

           INDIA-ITME 2008